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1

Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces

Kangguo Cheng, Jinju Lee, Karl, H., Lyding, J.W., Young-Kwang Kim, Young-Wug Kim, Kwang-Pyuk Suh

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 71 KB

english, 2002

2

Ultrathin gate oxide grown on nitrogen-implanted silicon for deep submicron CMOS transistors

In-Ho Nam, Jae Sung Sim, Sung In Hong, Byung-Gook Park, Jong Duk Lee, Seung-Woo Lee, Man-Sug Kang, Young-Wug Kim, Kwang-Pyuk Suh, Won Seong Lee

Journal:

IEEE Transactions on Electron Devices

Year:

2001

Language:

english

File:

PDF, 181 KB

english, 2001

3

Deuterium pressure dependence of characteristics and hot-carrier reliability of CMOS devices

Kangguo Cheng, Jinju Lee, Zhi Chen, Samir Shah, Karl Hess, Joseph W. Lyding, Young-Kwang Kim, Young-Wug Kim, Kuwang Pyuk Suh

Journal:

Microelectronic Engineering

Year:

2001

Language:

english

File:

PDF, 251 KB

english, 2001

4

Application of high pressure deuterium annealing for improving the hot carrier reliability of CMOS transistors

Jinju Lee,, Kangguo Cheng,, Zhi Chen,, Hess, K., Lyding, J.W., Young-Kwang Kim,, Hyui-Seung Lee,, Young-Wug Kim,, Kwang-Pyuk Suh,

Journal:

IEEE Electron Device Letters

Year:

2000

Language:

english

File:

PDF, 163 KB

english, 2000

5

Separation of hot-carrier-induced interface trap creation and oxide charge trapping in PMOSFETs studied by hydrogen/deuterium isotope effect

Cheng, K., Lee, J., Lyding, J.W., Young-Kwang Kim,, Young-Wug Kim,, Kuang Pyuk Suh,

Journal:

IEEE Electron Device Letters

Year:

2001

Language:

english

File:

PDF, 58 KB

english, 2001

6

[Japan Soc. Applied Phys 2003 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (10-12 June 2003)] 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) - Ultra low power 6T-SRAM chip with improved transistor performance and reliability by HfO/sub 2/-Al/sub 2/O/sub 3/ high-K gate dielectric process optimization

Chang-Bong Oh,, Hyuk-Ju Ryu,, Hee-Sung Kang,, Myoung-Hwan Oh,, Jong-Ho Lee,, Nae-In Lee,, Hyun-Woo Lee,, Cheol-Hee Jun,, Young-Wug Kim,, Kwang-Pyuk Suh,

Year:

2003

Language:

english

File:

PDF, 175 KB

english, 2003

7

[IEEE ICVC'99. 6th International Conference on VLSI and CAD - Seoul, South Korea (26-27 Oct. 1999)] ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) - Device characteristics and reliability for 0.18 μm MOSFET with 20 Å gate oxide formed by RTO

Jeong-Hwan Yang,, Dae-Rim Kang,, Seong-Ho Kwak,, Su-Cheol Lee,, Young-Wug Kim,, Kwang Pyuk Suh,

Year:

1999

Language:

english

File:

PDF, 308 KB

english, 1999

8

The effect of body contact arrangement on thin SOI MOSFET characteristics

Chang-Bong Oh, Jonghyon Ahn, Young-Wug Kim

Journal:

Microelectronic Engineering

Year:

1995

Language:

english

File:

PDF, 298 KB

english, 1995

9

[IEEE ICVC'99. 6th International Conference on VLSI and CAD - Seoul, South Korea (26-27 Oct. 1999)] ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) - Systematic calibration for transient enhanced diffusion of indium and its application to 0.15-μm logic devices

Jun-Ha Lee,, Seung-Woo Lee,, Jeong-Taek Kong,, Young-Wug Kim,

Year:

1999

Language:

english

File:

PDF, 287 KB

english, 1999

10

Thermal stability of atomic-layer-deposited HfO[sub 2] thin films on the SiN[sub x]-passivated Si substrate

Cho, Moonju, Park, Jaehoo, Park, Hong Bae, Hwang, Cheol Seong, Jeong, Jaehack, Hyun, Kwang Soo, Kim, Young-Wug, Oh, Chang-Bong, Kang, Hee-Sung

Journal:

Applied Physics Letters

Year:

2002

Language:

english

File:

PDF, 412 KB

english, 2002

11

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Improved current performance of CMOSFETs with nitrogen incorporated HfO/sub 2/-Al/sub 2/O/sub 3/ laminate gate dielectric

Hyung-Seok Jung,, Yun-Seok Kim,, Jong Pyo Kim,, Jung Hyoung Lee,, Jong-Ho Lee,, Nae-In Lee,, Ho-Kyu Kang,, Kwang-Pyuk Suh,, Hyuk Ju Ryu,, Chang-Bong Oh,, Young-Wug Kim,, Kyung-Hwan Cho,, H

Year:

2002

Language:

english

File:

PDF, 269 KB

english, 2002

12

[IEEE IEEE International Interconnect Technology Conference - Burlingame, CA, USA (2-4 June 2003)] Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) - Integration of MIM capacitors with low-k/Cu process for 90 nm analog circuit applications

Jeong-Hoon Ahm,, Kyung-Tae Lee,, Mu-Kyeung Jung,, Yong-Jun Lee,, Byung-Jun Oh,, Seong-Ho Liu,, Yoon-Hae Kim,, Young-Wug Kim,, Kwang-Pyuk Suh,

Year:

2003

Language:

english

File:

PDF, 201 KB

english, 2003

13

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Fully working 1.25 μm/sup 2/ 6T-SRAM cell with 45 nm gate length triple gate transistors

Jeong-Hwan Yang,, You-Seung Jin,, Hyae-Ryoung Lee,, Kyoung-Seok Rha,, Jung-A Choi,, Su-Kon Bae,, Maeda, S., Young-Wug Kim,, Kwang-Pyuk Suh,

Year:

2003

Language:

english

File:

PDF, 262 KB

english, 2003

14

[IEEE 1994 IEEE International SOI Conference - Nantucket, MA, USA (3-6 Oct. 1994)] Proceedings. IEEE International SOI Conference - Series resistance at metal contact for thin film SOI MOSFET

Chang-Bong Oh,, Jonghyon Ahn,, Sucheon Lee,, Young-Wug Kim,, Donghyun Kim,, Bonggi Kim,

Year:

1994

Language:

english

File:

PDF, 460 KB

english, 1994

15

Application of In-Situ Al-Flow Process for Triple-level Metallization

Lee, Ki-Young, Lee, Su-Cheon, Kim, Young-Wug

Journal:

Japanese Journal of Applied Physics

Year:

1996

File:

PDF, 1.43 MB

1996

16

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Fully working 1.10 /spl mu/m/sup 2/ embedded 6T-SRAM technology with high-k gate dielectric device for ultra low power applications

Hyuk-Ju Ryu,, Woo-Young Chung,, You-Jean Jang,, Yong-Jun Lee,, Hyung-Seok Jung,, Chang-Bong Oh,, Hee-Sung Kang,, Young-Wug Kim,

Year:

2004

Language:

english

File:

PDF, 197 KB

english, 2004

17

SET/CMOS hybrid process and multiband filtering circuits

Ki-Whan Song, Yong Kyu Lee, Jae Sung Sim, Hoon Jeoung, Jong Duk Lee, Byung-Gook Park, You Seung Jin, Young-Wug Kim

Journal:

IEEE Transactions on Electron Devices

Year:

2005

Language:

english

File:

PDF, 1.05 MB

english, 2005

18

[IEEE Eighth International Application Specific Integrated Circuits Conference - Austin, TX, USA (18-22 Sept. 1995)] Proceedings of Eighth International Application Specific Integrated Circuits Conference - Cost-effective process integration for a high performance 0.5 μm CMOS logic device

Young-Wug Kim,, Yongsik Kim,, Chang-Bong Oh,, Bong-Seok Kim,, Jong Shik Yoon,, Bonggi Kim,

Year:

1995

Language:

english

File:

PDF, 352 KB

english, 1995

19

[IEEE 2006 IEEE International Conference on Semiconductor Electronics - Kuala Lumpur, Malaysia (2006.10.29-2006.12.1)] 2006 IEEE International Conference on Semiconductor Electronics - Integrated LC VCO Compatible with Memory Process for Gigahertz Clock Generation

Choi, Minseok, Jung, Youngho, Yoon, Yeo Jo, Kim, Young-Wug, Shin, Hyungcheol

Year:

2006

Language:

english

File:

PDF, 1.07 MB

english, 2006

20

[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - Three dimensional analysis of thermal degradation effects in FDSOI MOSFETs

Kwan-Do Kim,, Young-Kwan Park,, Jun-Ha Lee,, Jeong-Taek Kong,, Hee-Sung Kang,, Young-Wug Kim,, Seok-Jin Kim,

Year:

2000

Language:

english

File:

PDF, 608 KB

english, 2000

21

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - Highly stable SOI technology to suppress floating body effect for high performance CMOS device

Hee Sung Kang,, Young-Wug Kim,, Kong-Soo Chung,, Ki Mum Nam,, Kumjong Bae,, Nae-In Lee,, Chang-Bong Oh,, Kwang Il Kim,, Sungbae Park,, Kwang-Pyuk Suh,

Year:

2001

Language:

english

File:

PDF, 349 KB

english, 2001

22

[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Negative bias temperature instability in triple gate transistors

Shigenobu Maeda,, Jung-A Choi,, Jeong-Hwan Yang,, You-Seung Jin,, Su-Kon Bae,, Young-Wug Kim,, Kwang-Pyuk Suh,

Year:

2004

Language:

english

File:

PDF, 346 KB

english, 2004

23

An alternative interpretation of hot electron interface degradation in NMOSFETs: isotope results irreconcilable with major defect generation by holes?

Hess, K., Jinju Lee, Zhi Chen, Lyding, J.W., Young-Kwang Kim, Bong-Seok Kim, Yong-Hee Lee, Young-Wug Kim, Kwang-Pyuk Suh

Journal:

IEEE Transactions on Electron Devices

Year:

1999

Language:

english

File:

PDF, 68 KB

english, 1999

24

Microstructures of Tungsten Suicide Films Deposited by CVD and by Sputtering

Kim, Young-Wug, Lee, Nae-In, Park, Moon-Han

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 2.38 MB

english, 1994

25

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Impact of mechanical stress engineering on flicker noise characteristics

Maeda, S., You-Seung Jin,, Jung-A Choi,, Sun-Young Oh,, Hyun-Woo Lee,, Jae-Yoon Yoo,, Min-Chul Sun,, Ja-Hum Ku,, Kwon Lee,, Su-Gon Bae,, Sung-Gun Kang,, Jeong-Hwan Yang,, Young-Wug Kim,, K

Year:

2004

Language:

english

File:

PDF, 181 KB

english, 2004

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